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By Slawomir Wiak, Andrzej Krawczyk, Ivo Dolezel

ISBN-10: 1586038958

ISBN-13: 9781586038953

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Extra resources for Advanced Computer Techniques in Applied Electromagnetics (Studies in Applied Electromagnetics)

Sample text

In another works we aimed ourselves to finding geometry and some additional defect properties in metals. After the experimentally confirmation the fact that the defect can be examinate as a special waveguide section we engaged in examination of its impedance properties enabling to obtain more precision information about the defect, [2]. The next experiments were directed at the defect depth settling by utilizing of microwave knowledge. g. ferrite circulator) or by means of standing wave ratio (SWR) measurement and subsequent adoption of measured values (impedance character, minimum standing wave shift and like that), [2].

In the case according to Fig. 3a with the matched load in the port A and the indicator in the port D, the signal indicated in the port D will be proportional to the reflection coefficient from the port B. This way in our measurement port B was terminated with the open-waveguide probe and the sample with a defect (width 0,5 mm, depth 8,5 mm) was shifted in front of it. Corresponding graph is plotted in the Fig. 4, curve a. Measurement in connection according to Fig. 3b was performed for the purpose of getting a facility for simple measuring of the crack depth.

Close-circuited barriers, described in this paper are characterized by different effects. In these systems reflection coefficient’s (kr ) value equal 1, because of reflection energy effect inside barrier’s structures, hence after multiple reflection, all energy is absorbed by the conducting material. These barriers have a very good attenuation rate for magnetic fields, but not for electric ones. In Fig. 1 the relative magnetic and electric field intensities leaving steel and copper barriers are shown.

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Advanced Computer Techniques in Applied Electromagnetics (Studies in Applied Electromagnetics) by Slawomir Wiak, Andrzej Krawczyk, Ivo Dolezel

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